Chris Lucas, Willie Chen, Eric Yuen, William Kaiser, and 3 more January 1, 2004
Abstract: Metrology presents NIMS with a way to monitor specific objects in the environment such as plants and leaves. The addition of sensor fusion allows NIMS to analyze objects from multiple perspectives and provide detailed information on objects in the environment.
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- AuthorsChris Lucas, Willie Chen, Eric Yuen, William Kaiser, Michael Stealey, Steve Liu, Yueng Lam
- Deposited January 3, 2022
- Available January 3, 2022
- ISSN--
- Text Versionqt49b1n75d.pdf.txt
- PDF Versionqt49b1n75d.pdf